S. Pagey: search on Z-Library

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1

Universal TSC module and its application to the design of TSC circuits

S. Pagey, A.J. Al-Khalili

Journal:

Microelectronics Journal

Year:

1997

Language:

english

File:

PDF, 927 KB

english, 1997

2

Optimisation of extrusion die profile to satisfy metallurgical and manufacturing criteria

Pathak, K. K., Pagey, Vikas S., Ramakrishnan, N.

Journal:

Materials Science and Technology

Year:

2010

Language:

english

File:

PDF, 296 KB

english, 2010

3

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Unified model for n-channel hot-carrier degradation under different degradation mechanisms

Pagey, M., Milanowski, R., Snyder, E., Bui, N., Deem, B., Bhuva, B., Kerns, S.

Year:

1996

Language:

english

File:

PDF, 470 KB

english, 1996

4

[IEEE Comput. Soc. Press 8th International Conference on VLSI Design - New Delhi, India (4-7 Jan. 1995)] Proceedings of the 8th International Conference on VLSI Design - A new methodology for the design of low-cost fail safe circuits and networks

Kishore, B.R., Parekhji, R.A., Pagey, S., Sherlekar, S.D., Venkatesh, G.

Year:

1995

Language:

english

File:

PDF, 418 KB

english, 1995

5

TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs

Milanowski, R.J., Pagey, M.P., Massengill, L.W., Schrimpf, R.D., Wood, M.E., Offord, B.W., Graves, R.J., Galloway, K.F., Nicklaw, C.J., Kelley, E.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 1.05 MB

english, 1998

6

[IEEE 2007 IEEE Nuclear Science Symposium Conference Record - Honolulu, HI, USA (2007.10.26-2007.11.3)] 2007 IEEE Nuclear Science Symposium Conference Record - Geometrically optimized, Labr3: Ce scintillation sensor array for enhanced stand-off direction finding of gamma radiation sources

Winso, James H., Ackermann, Eric S., Fennell, Michael, Perez, Roger, Rolando, John, Pagey, Manish, Polichar, Raulf, Martinez, Juan, Hovgaard, Jens, Kogut, Greg, Everett, H. R. (Bart), Fellars, Donnie,

Year:

2007

Language:

english

File:

PDF, 397 KB

english, 2007

7

[IEEE 2009 Tenth International Conference on Mobile Data Management: Systems, Services and Middleware - Taipei, Taiwan (2009.05.18-2009.05.20)] 2009 Tenth International Conference on Mobile Data Management: Systems, Services and Middleware - Caching as Privacy Enhancing Mechanism in Location-Based Services

Pagey, Himanshu, Hua, Kien, Lin, Chow-Sing

Year:

2009

Language:

english

File:

PDF, 810 KB

english, 2009

8

Ball in the Wall: Mesenteric Fibromatosisâa Rare Case Report

Deshpande, Abhinav, Tamhane, Ankita, Deshpande, Y. S., Pagey, Radhika, Pangarkar, Meena

Journal:

Indian Journal of Surgical Oncology

Year:

2020

File:

PDF, 336 KB

2020

9

[IEEE Comput. Soc. Press First Asian Test Symposium (ATS `92) - Hiroshima, Japan (26-27 Nov. 1992)] Proceedings First Asian Test Symposium (ATS `92) - Techniques for reducing hardware requirement of self checking combinational circuits

Pagey, S., Sherlekar, S.D., Venkatesh, G.

Year:

1992

Language:

english

File:

PDF, 528 KB

english, 1992

10

TCAD-based simulation of hot-carrier degradation in p-channel mosfets using silicon energy-balance and oxide carrier-transport equations

Mukundan, S. K., Pagey, M. P., Cirba, C. R., Schrimpf, R. D., Galloway, K. F.

Journal:

Journal of Technology Computer Aided Design TCAD

Year:

1996

Language:

english

File:

PDF, 673 KB

english, 1996

11

A hydrogen-transport-based interface-trap-generation model for hot-carrier reliability prediction

Pagey, M.P., Schrimpf, R.D., Galloway, K.F., Nicklaw, C.J., Ikeda, S., Kamohara, S.

Journal:

IEEE Electron Device Letters

Year:

2001

Language:

english

File:

PDF, 49 KB

english, 2001

12

[IEEE 2010 IEEE 12th Conference on Commerce and Enterprise Computing (CEC) - Shanghai, China (2010.11.10-2010.11.12)] 2010 IEEE 12th Conference on Commerce and Enterprise Computing - TagPay: A Payment Atomic RFID Ownership Transfer Protocol

Pagey, Himanshu, Hua, Kien A.

Year:

2010

Language:

english

File:

PDF, 316 KB

english, 2010

13

Process and die design for rod extrusion of γ iron

K. K. Pathak, Vikas S. Pagey, V. K. Sethi

Journal:

International Journal of Material Forming

Year:

2009

Language:

english

File:

PDF, 242 KB

english, 2009

14

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Simulation of hot-carrier degradation using self-consistent solution of semiconductor energy-balance equations and oxide carrier transport equations

Mukundan, S.K., Pagey, M.P., Schrimpf, R.D., Galloway, K.F.

Year:

1999

Language:

english

File:

PDF, 427 KB

english, 1999

15

Defects and nanocrystals generated by Si implantation into a-SiO/sub 2/

Nicklaw, C.J., Pagey, M.P., Pantelides, S.T., Fleetwood, D.M., Schrimpf, R.D., Galloway, K.F., Wittig, J.E., Howard, B.M., Taw, E., McNeil, W.H., Conley, J.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 271 KB

english, 2000

16

[IEEE 38th Midwest Symposium on Circuits and Systems. - Rio de Janeiro, Brazil (13-16 Aug. 1995)] 38th Midwest Symposium on Circuits and Systems. Proceedings - Universal TSC module and its application to the design of TSC circuits

Pagey, S., Al-Khalili, A.J.

Year:

1996

Language:

english

File:

PDF, 554 KB

english, 1996

17

[IEEE Comput. Soc. Press First Asian Test Symposium (ATS `92) - Hiroshima, Japan (26-27 Nov. 1992)] Proceedings First Asian Test Symposium (ATS `92) - Issues in fault modelling and testing of micropipelines

Pagey, S., Sherlekar, S.D., Venkatesh, G.

Year:

1992

Language:

english

File:

PDF, 413 KB

english, 1992

18

A methodology for the design of SFS/SCD circuits for a class of unordered codes

Sandeep Pagey, S. D. Sherlekar, G. Venkatesh

Journal:

Journal of Electronic Testing

Year:

1991

Language:

english

File:

PDF, 1.20 MB

english, 1991

19

[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - State encoding and functional decomposition for self-checking sequential circuit design

Pagey, S., Sherlekar, S.D., Venkatesh, G.

Year:

1993

Language:

english

File:

PDF, 407 KB

english, 1993

20

[IEEE 2006 IEEE Aerospace Conference - Big Sky, MT, USA (04-11 March 2006)] 2006 IEEE Aerospace Conference - SEU Mitigation for Reconfigurable FPGAs

Czajkowski, D.R., Samudrala, P.K., Pagey, M.P.

Year:

2006

Language:

english

File:

PDF, 5.91 MB

english, 2006

21

Retention of adolescents with substance dependence and coexisting mental health disorders in outpatient alcohol and drug group therapy

Bronwyn Pagey, Daryle Deering, Doug Sellman

Journal:

International Journal of Mental Health Nursing

Year:

2010

Language:

english

File:

PDF, 319 KB

english, 2010

22

[IEEE Comput. Soc. Press Fourth Asian Test Symposium - Bangalore, India (23-24 Nov. 1995)] Proceedings of the Fourth Asian Test Symposium - Fast functional testing of delay-insensitive circuits

Year:

1995

Language:

english

File:

PDF, 658 KB

english, 1995

23

Combined effect of X-irradiation and forming gas anneal on the hot-carrier response of MOS oxides

Milanowski, R.J., Pagey, M.P., Matta, A.I., Bhuva, B.L., Massengill, L.W., Kerns, S.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1993

Language:

english

File:

PDF, 693 KB

english, 1993

24

Comparison of forming gas, nitrogen, and vacuum anneal effects on X-ray irradiated MOSFETs

Pagey, M.P., Milanowski, R.J., Henegar, K.T., Bhuva, B.L., Kerns, S.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 728 KB

english, 1995

25

[IEEE 22nd International Conference on Advanced Information Networking and Applications - Workshops (aina workshops 2008) - Gino-wan, Okinawa, Japan (2008.03.25-2008.03.28)] 22nd International Conference on Advanced Information Networking and Applications - Workshops (aina workshops 2008) - Building User Confidence in RFID Technology for Mobile and Retail Environments

Pagey, Himanshu

Year:

2008

Language:

english

File:

PDF, 622 KB

english, 2008

26

[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - Application of byte error detecting codes to the design of self-checking circuits

Pagey, S., Al-Khalili, A.J.

Year:

1994

Language:

english

File:

PDF, 585 KB

english, 1994

27

[IEEE Comput. Soc. Press Conference Record of The Twenty-Ninth Asilomar Conference on Signals, Systems and Computers - Pacific Grove, CA, USA (30 Oct.-2 Nov. 1995)] Conference Record of The Twenty-Ninth Asilomar Conference on Signals, Systems and Computers - Universal TSC module and its application to the design of TSC circuits

Pagey, S., Al-Khalili, A.J.

Year:

1996

Language:

english

File:

PDF, 410 KB

english, 1996

28

[IEEE 2005 IEEE Aerospace Conference - Big Sky, MT, USA (2005.03.5-2005.03.12)] 2005 IEEE Aerospace Conference - Low Power, High-Speed Radiation Hardened Computer & Flight Experiment

Czajkowski, D.R., Pagey, M.P., Samudrala, P.K., Goksel, M., Viehman, M.J.

Year:

2005

Language:

english

File:

PDF, 7.57 MB

english, 2005

29

[IEEE Comput. Soc. Press Fourth Asian Test Symposium - Bangalore, India (23-24 Nov. 1995)] Proceedings of the Fourth Asian Test Symposium - DFT for fast testing of self-timed control circuits

Pagey, S., Khoche, A., Brunvand, E.

Year:

1995

Language:

english

File:

PDF, 594 KB

english, 1995

30

Management of behavioural change in patients presenting with a diagnosis of dementia: a video vignette study with Australian general practitioners

Jiwa, M., Nichols, P., Magin, P., Pagey, G., Meng, X., Parsons, R., Pillai, V.

Journal:

Year:

2014

Language:

english

File:

PDF, 1.70 MB

english, 2014

31

Application of byte error detecting codes to the design of self-checking circuits

Sandeep Pagey, Asim J. Al-Khalili

Journal:

Microelectronics Journal

Year:

1998

Language:

english

File:

PDF, 773 KB

english, 1998

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